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Title of Article

DISCRETE TUNNELING IN nc-Si/Al2O3 MULTILAYER NANOPERIODIC STRUCTURES


Issue
3
Date
2011

Section
SOLID-STATE PHYSICS

Article type
scientific article
UDC
621.793; 539.21; 538.935
Pages
44-49
Keywords
silicon, nanocrystal, alumina, multilayer nanoperiodic structures, electron transport, tunneling, Coulomb blockade


Authors
Chugrov Ivan Aleksandrovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Demidov Evgeniy Sergeevich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Ershov Aleksey Valentinovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo


Abstract
The results of experimental studies are presented of current-voltage characteristics of multilayered (18 layers) nanoperiodic (9-20 nm) structures (MNSs) with alternating ultra-thin layers of SiOx and Al2O3. MNSs have been annealed at high temperature (1100 ?C) to form Si nanocrystals in the SiOx layers. The results are interpreted using the discrete tunneling theory, based on the consideration of the Coulomb blockade of electron tunneling along the chains of Si quantum dots separated by insulating barriers. The calculated number and sizes of Si grains participating in electron transport are in good agreement with the number and initial thickness of MNS SiOx layers. The latter testifies to the correctness of the discrete tunneling model and the formation during the annealing process of Si nanocrystals with sizes limited by the thickness of SiOx layers.

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