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Title of Article

DETERMINATION OF THE COMPOSITION AND THICKNESS OF DOUBLE-LAYER Fe-Ni-Mo/Cr BY X-RAY FLUORESCENCE ANALYSIS


Issue
2
Date
 2009

Article type
 scientific article
UDC
543.42
Pages
89-95
Keywords
X-ray fluorescence analysis, thin double-layer film, composition and thickness of a film, mutual interference, effects of elements


Authors
Mashin N.I.
Nauchno-issledovatelskiy institut khimii Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo

Leonteva A.A.
Nauchno-issledovatelskiy institut khimii Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo

Lebedeva R.V.
Nauchno-issledovatelskiy institut khimii Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo

Tumanova A.N.
Nauchno-issledovatelskiy institut khimii Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo


Abstract
A procedure has been developed for the determination of component composition and thickness of double-layer Fe-Ni-Mo/Cr films on Polikor by X-ray fluorescence analysis. Correction factors taking into account mutual interference of system elements have been calculated. The densities of film materials have experimentally been determined. Metrological characteristics of the procedure have been determined and presented.

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