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Title of Article

DETERMINATION OF MASS ABSORPTION COEFFICIENT IN X-RAY FLUORESCENCE ANALYSIS OF THIN TWO-LAYER FILMS


Issue
5
Date
2010

Article type
scientific article
UDC
539.216.2+535.33/34+543.422.8
Pages
53-56
Keywords
X-ray fluorescence analysis, thin two-layer film, correction coefficient, mass absorption coefficient, substrate, polymer film


Authors
Mashin Nikolay Ivanovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Leonteva Anna Aleksandrovna
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Tumanova Alla Nikolaevna
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Ershov Anton Alekseevich
Nizhegorodskiy nauchno-issledovatelskiy institut radiotekhniki

Ershov Aleksey Valentinovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo


Abstract
A new procedure to determine the mass absorption coefficient in two-layer system of Ni/Ge/Polikor has been proposed. The procedure is based on the use of simple manufactured unified single and unicomponent layers of sputtered nickel on a polymer film substrate. The correction coefficient has been calculated which takes into account the absorption of primary radiation of the X-ray tube and the analytical line of the bottom layer element in the top layer.

File (in Russian)