Главная страница
russian   english
16+
<< back

Title of Article

PHOTOLUMINESCENCE MECHANISM OF SiO2 FILMS WITH ION-SYNTHESIZED Si NANOCRYSTALS


Issue
5
Date
2010

Article type
scientific article
UDC
537.9: 539.534.9: 535.37
Pages
260-263
Keywords
silicon nanocrystal, quantum dot, silicon dioxide, ion implantation, photoluminescence mechanism, exciton energy splitting, exciton migration, interface states


Authors
Belov Aleksey Ivanovich
Nauchno-issledovatelskiy fiziko-tekhnicheskiy institut Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo

Vikhoreva Yuliya Vasilevna
Nauchno-issledovatelskiy fiziko-tekhnicheskiy institut Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo

Kostyuk Aleksey Borisovich
Nauchno-issledovatelskiy fiziko-tekhnicheskiy institut Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo

Mikhaylov Aleksey Nikolaevich
Nauchno-issledovatelskiy fiziko-tekhnicheskiy institut Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo

Tetelbaum David Isaakovich
Nauchno-issledovatelskiy fiziko-tekhnicheskiy institut Nizhegorodskogo gosuniversiteta im. N.I. Lobachevskogo


Abstract
The temperature dependence of photoluminescence of thermal SiO2 films with Si nanocrystals ion-synthesized at excess Si concentration of ~ 10 at.% and annealing temperature of 1100°C has been used to calculate exciton energy splitting assuming the interband mechanism of quantum dot luminescence. The observed deviation from the theoretical splitting value dependence is discussed for nanocrystal sizes smaller than 3.3 nm.

File (in Russian)