ON THE FORMATION OF ZIRCONIUM NANOCLUSTERS IN YTTRIA STABILIZED ZIRCONIA BY ION IRRADIATION |
5 | |
2010 |
PHYSICS AND TECHNOLOGY OF THIN FILMS |
scientific article | 538.958:539.534.9 | ||
271-278 | yttria stabilized zirconia, thin films, RF magnetron sputtering method, ion implantation, tunnel electron microscopy, atomic force microscopy, nanosized metallic particles |
Using yttria stabilized zirconia as an example, a new mechanism has been found of metallic nanoinclusion formation in ion-irradiated oxides with high mobility of oxygen. It is shown that the formation of zirconium nanoinclusions by ion irradiation may take place both at penetration of metallic ions into the matrix and creation in this way of oversaturated solutions, and also as a result of oxygen release from the near-surface layer in the process of ion irradiation. The effect was first observed at the irradiation by inert gas ions (He |
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