SOME FEATURES OF THE CHANGE IN ELECTRONIC AND OPTICAL PROPERTIES OF YTTRIA STABILIZED ZIRCONIA IRRADIATED WITH Au IONS AT LOW FLUENCE |
5 | |
2010 |
scientific article | 538.958:539.534.9 | ||
283-287 | yttria-stabilized zirconia (YSZ), thin films, RF magnetron sputtering method, ion implantation, Au ions, tunnel electron microscopy, atomic force microscopy, nanosized metallic particles |
Electrophysical properties are studied of yttria stabilized zirconia (YSZ) thin films (with a thickness of 12 nm) deposited on the silicon substrates by the RF magnetron sputtering method and irradiated with Au ions at 60 keV average energy and a fluence of 2.5 |
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