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Title of Article

PHOTOLUMINESCENCE OF Si3N4 FILMS ENRICHED WITH SILICON BY ION IMPLANTATION METHOD


Issue
5
Date
2010

Article type
scientific article
UDC
539.534.9
Pages
298-301
Keywords
silicon nitride, luminescent properties, ion implantation, silicon nanocrystals


Authors
Demidov Evgeniy Sergeevich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Dobychin Nikolay Aleksandrovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Karzanov Vadim Vyacheslavovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Marychev Mikhail Olegovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Sdobnyakov Viktor Vladimirovich
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo

Khazanova Sofya Vladislavovna
Nizhegorodskiy gosuniversitet im. N.I. Lobachevskogo


Abstract
Photoluminescence of pyrolytic Si3N4 films enriched with silicon by ion implantation method was investigated. It has been shown that the introduction of silicon with subsequent annealing allows one to control the spectrum of intrinsic PL of amorphous silicon nitride, changing its intensity and red-shifting it by 40-50 nm. Alongside main PL band, silicon introduction leads to the occurrence of an additional luminescence peak at a wavelength near ?=700 nm, whose intensity depends on the dose and temperature of the subsequent annealing.

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