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Title of Article

SIMULATING ELECTRONIC CIRCUIT PERFORMANCE UNDER RADIATION EXPOSURE


Issue
2
Date
2013

Article type
scientific article
UDC
539.16.04
Pages
52-55
Keywords
mathematical model, radiation effects, bipolar transistor, semiconductor diode.


Authors
Khananova Aleksandra Viktorovna
Rossiyskiy federalnyy yadernyy tsentr – Vserossiyskiy nauchno-issledovatelskiy institut tekhnicheskoy fiziki im. akademika E.I. Zababakhina, Snezhinsk

Averyaskin Anton Sergeevich
Rossiyskiy federalnyy yadernyy tsentr – Vserossiyskiy nauchno-issledovatelskiy institut tekhnicheskoy fiziki im. akademika E.I. Zababakhina, Snezhinsk


Abstract
A procedure is proposed to account for the effect of neutron irradiation on electronic components by varying the parameters of their models. The formulas are given to calculate SPICE model parameters of a bipolar transistor and a semiconductor diode depending on the neutron fluence. Electric current generators are to be integrated into the electric circuits to take into account ionizing radiation effects. Simulation results for some circuit sections are presented.

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