QUALITY ESTIMATION OF ZNS/ZNSE OPTICAL SURFACES USING ATOMIC FORCE MICROSCOPY AND COMPUTER VISION TECHNIQUES |
| 5 | |
| 2013 |
| scientific article | 681.3: 681.7.023.72 | ||
| 61-65 | optical microscopy, computer vision techniques (CVT), atomic-force microscopy (AFM), zinc selenide (ZnSe), zinc sulfide (ZnS), surface quality, surface roughness. |
| AFM- and CVT- based techniques have been developed to estimate the quality of optical element surfaces made of zinc selenide and zinc sulfide. |
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