The optoelectronic speckle-interferometer designed for precision contactless control of critical elements and units of engineering structures, detection of internal defects of layered materials or residual pressure in details, studying the form of natural resonant fluctuations of objects, visualization of optical inhomogeneity in phase objects, etc. is presented. A distinctive feature of the speckle interferometer is that the high-frequency speckle-structure of the diffused object is used as a basic signal. The method of decoding of interferograms is presented, where the virtual surface ? a spline is formed, i.e. a mathematical function describing deformation of the surface of a real object is offered. The given technique allows simplifying and accelerating the process of processing of experimental interferograms. The optoelectronic speckle-interferometer described in this article is used to experimentally investigate the dynamics of deformation of surfaces under the effect of temperature fields.
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