ON PHYSICAL MECHANISMS OF FLICKER NOISE GENERATION IN TI-AU/GAAS SCHOTTKY DIODES |
| 1 | |
| 2014 |
| scientific article | 621.391.822 | ||
| 158-162 | : Schottky diode, low-frequency noise, current-voltage characteristic |
| Current flow inhomogeneity in diodes with metal-semiconductor contact has been found. As a result, additional components of the diode current are detected in the I-V curve. One of the components has a quasi-ohmic character and appears at rather small currents. The second additional component is a thermionic-field emission current. These mechanisms are shown to be the sources of low-frequency noise in such diodes. |
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